Author: Barrett Nehilla

Transwells interfere with Tecan measurements

This week, Christine and I have been trying to figure out if we can measure transport in the Tecan with the transwell inserts remaining within the 24-well plates.  Here is a schematic of our idea (with sodium fluorescein, Na-F, as

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Plate geometry matters in Tecan!

Christine and I have been using the present Corning 24-well plate definition in the Tecan for our experiments so far.  Yesterday I placed a pnc-Si chip in the (approximate) middle on the bottom of 1 of the 24-wells.  I did

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'Imaging' in the Tecan

Jim and I were wondering if we could “image” the membrane windows with the Tecan. A nice thing about the Tecan is that you can specify the number of measurements per well.  For example, in this study, I acquired a

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HUVEC adhesion – pnc-Si vs. PET

I recently completed a HUVEC adhesion study with commercial PET and pnc-Si transwells.  HUVEC were seeded @ 100000 cells/cm^2, allowed to attach for 5 hours (upside down format) and then stained with CMFDA.  Images were acquired without autocontrast, but I

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HUVEC morphology recovers on pnc-Si

Since HUVEC morphology hasn’t looked good in short-term adhesion assays recently, I analyzed HUVEC on the 2nd day after cell seeding. Normally, CMFDA staining is done for 30-45 minutes in serum-free media.  I wondered if the serum-free environment during staining

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HUVEC adhesion – high cell seeding densities

This was my first experiment in which the Sepcons were inverted for cell adhesion.  After allowing the cells to attach for 4.5 hours, I inverted the Sepcons in media for staining with CMFDA.  Therefore, the Sepcon is set up so

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AFM-Pore Processing analysis of Discoloration

This is a continuation of the last post on AFM analysis of pore changes during discoloration.  I took the AFM images, inverted them in ImageJ so that the pores would be white and then did PoreProcessing in MATLAB.  I simply

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AFM analysis of discoloration

To complement the recent study which investigated pore changes during discoloration with TEM, I did AFM on the same samples.  These were w673 samples which were incubated in DMEM (-FBS) in the 37C oven.  We didn’t use FBS because I

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AFM – wafer characterization

Chris gave me a few wafers to look at with AFM – an oxide sputtered in the recently cleaned chamber and VA Semiconductor wafers cleaned with “Normal Power” or “Full Power” Megasonics.  I employed a couple of new “tricks” to

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Discoloration in cell culture conditions

Lately, Anant and I have been doing our discoloration experiments under purposely harsh conditions so we don’t have to wait for multiple days for experiments to finish. We have lots of evidence that the 3D format slows down discoloration (post1,

Posted in NRG
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