Tag: characterization

W612 Pinhole Counts: Interesting Features

I am in the process of inspecting each membrane in the newly created wafer 612. First of all, some samples (~10% counted so far) have tears on the membrane edges, shown below. Images were taken at 20x microscope magnification (reflection

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Pinhole Study: W510

To improve our knowledge of pinhole formation I have started counting pinholes on W510, W512, and W513. I also am playing close attention to areas surrounding the samples that have been completely etched, to see if this correlates to pinhole

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