Author: Mingzhi Xu

The Yimei Method for Analyzing PDMS Beam Deflection in the μSiM Vasc-SkM

Image analysis for force from videos of deflected PDMS beams In the summer, Yimei Du from University of Rochester visited Truskey lab to help with the μSiM Vasc-SkM system. Besides working with the chip culture, she helped improve the image

Posted in TRACE

μSiM Vasc-SkM update 2025.06.24

Since the last TraCe-bMPS update in April, we continued to explore different conditions to optimize the μSiM hVasc-SkM systems to obtain stable results.  Enhanced imaging for PDMS beams with Rhodamine staining  Previously we established a MATLAB program that detects the

Posted in TRACE

μSiM Vasc-SkM update 2024.03.13

The μSiM Vasc-SkM Microphysiological development can be separated into 4 parts: Media tuning for integrated culture Force sensing element setup Assembly of the μSiM Vasc-SkM and setting up the perfusion Transendothelial Electrical Resistance (TEER) measurement of the Vast component Work

Posted in TRACE
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