Category: NRG

Contact Angle Study

According to recent cell adhesion studies on aminosilanized pncSi, no significant difference between adherence to the silanized and non-silanized surfaces was found. This could have been due to the adsorption of protein from the cell growth media onto the surface

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HUVEC adhesion – high cell seeding densities

This was my first experiment in which the Sepcons were inverted for cell adhesion.  After allowing the cells to attach for 4.5 hours, I inverted the Sepcons in media for staining with CMFDA.  Therefore, the Sepcon is set up so

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Cell Adhesion Study (Trial 2)

I repeated the previous experiment, this time plating slightly higher density of cells: ~15100 cells/sq.cm. Samples were from the same W673, no RTP) After counting the cells stained using Calcein AM, % Adhesion w.r.t the cells plated were found to

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Electroosmotic Theory

This is something that’s been living on my knowledge page, but I think it’s a good idea to put it up here to get some discussion on it. Probstein gives the following equation for electroosmotic velocity in his book Physicochemical

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Cell Adhesion Study (on silanized surface)

We have seen before that silanization slows down discoloration and hence prevents membrane degradation. In Sepcon, the sample should last over a week. Further, it was necessary to check whether silanized surface supports normal cell growth. Therefore, comparison of cell

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AFM-Pore Processing analysis of Discoloration

This is a continuation of the last post on AFM analysis of pore changes during discoloration.  I took the AFM images, inverted them in ImageJ so that the pores would be white and then did PoreProcessing in MATLAB.  I simply

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AFM analysis of discoloration

To complement the recent study which investigated pore changes during discoloration with TEM, I did AFM on the same samples.  These were w673 samples which were incubated in DMEM (-FBS) in the 37C oven.  We didn’t use FBS because I

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RTP + Silanization (3D format)

As seen before, in 2D format ‘RTP+silanization’ helps. Similarly in 3D format, with membrane side down, the same treatment helps prevent discoloration till 5 days. (samples from W413) Above figure shows how combined effect of RTP and silanization is better

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AFM – wafer characterization

Chris gave me a few wafers to look at with AFM – an oxide sputtered in the recently cleaned chamber and VA Semiconductor wafers cleaned with “Normal Power” or “Full Power” Megasonics.  I employed a couple of new “tricks” to

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Pore processing of DMEM incubated samples

In continuation of the previous post, I ran the pore processing software for two samples (t=0 and t=150 min). The following histograms show the pore parameters and the difference in the pore size and numbers between the two samples. I

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