This is a continuation of earlier work showing 30-100-30 NSN x-sections where the Si layer thickness increases from ~92 nm before RTP to ~130 nm after RTP. Below are SEMs showing a ~50 nm thick a-Si film becoming a ~62 nm…
Tag: INT
SEMs of burst 30-50-30 NSN SEPCON
Below are some SEM images of a burst 30-50-30 NSN membrane in a SEPCON pattern. Many similar chips failed at lower pressures, but this one survived to ~5-7 psi. (didn’t keep close track of the chips after they were burst,…
NSN SEPCONs
Still trying to reproduce Joe’s large pore material on SEPCONs using NSN stacks. This post has data from two wafers with 30/50/30 and 30/100/30 NSN. RTP is 1000C 50C/s for 1min. Nitride is etched off by placing samples in 50%…
More details on INT cartridge's "desalting" column
First things first, the desalting column is not intended to desalt. Apparently that’s just an old name that has carried over. The current purpose is to separate viruses from large debris after sonication. The sample in a buffer solution will…
New Cartridge from INT
INT received the first samples of their new cartridge design. The following slides were given to us by INT to provide some detail. The shorter cylinder on the left that is called the “glass bead pod” needs on filter fixed…
Mtg with INT
Karl and I went to INT to meet with Mike Connolly and Rick Murante for preliminary discussions on the PFI project. Our role as proposed in the grant is to provide membranes capable of eliminating false positives by using ~20nm…
